特性和优点
出色的电子性能
高探头带宽
快速探头上升时间
出色的信号保真度
≤0.8 pF 输入电容
40 kΩ 输入电阻
-4 V 至 +4 V 输入动态范围
-10 V 至 +10 VDC 输入偏置范围
±30 V（直流 + 峰值交流）输入电压（非破坏）
全面的机械性能
用于探测小型几何电路元件的紧凑型探头头部
可使用 DUT 附属附件连接到小至 0.5 毫米针脚的 SMD
强大的可靠性设计
易用
直接连接到具有 TekVPI™ 探头接口的示波器
在示波器画面上实现自动单位缩放和读数
轻松访问示波器探头菜单画面以了解探头状态/诊断信息和控制探头直流偏置
通过示波器实现远程 GPIB/USB 探头控制
应用
高速设计的验证、调试和检定
信号完整性、抖动和定时分析
制造工程和测试
信号的电压摆幅高达 8 Vpk-pk
为应用选择合适的探头是在测量中取得信号保真度的关键。有源探头为高频测量提供了更真实的信号复制和保真度。通过超低输入电容和的接口，TAP2500 和 TAP3500 单端有源 FET 探头提供了当今数字系统设计所需要的高速电子和机械性能。
TAP2500 和 TAP3500 有源 FET 探头经过专门设计，可使用并直接连接到带有 TekVPI™ 探头接口的示波器，通过解决以下三个传统问题来实现高速信号采集和测量保真度：
通过 ≤0.8 pF 输入电容和 40 kΩ 输入阻抗降低 DUT 负载效应
利用多功能 DUT 连接可连接到小型 SMD
在探头端部为高达 3.5 GHz 的示波器保留仪器带宽
Features and benefits
Excellent electronic performance
High probe bandwidth
Fast probe rise time
Excellent signal fidelity
Input capacitance 0.8pf
40 k Ω input resistance
-4v to + 4v input dynamic range
-10v to + 10vdc input bias range
Maximum input voltage (non-destructive)
Overall mechanical properties
Compact probe head for detecting small geometric circuit elements
The DUT attachment can be used to connect to SMD pins as small as 0.5 mm
Strong reliability design
Easy to use
Directly connected to a TekVPI ™ oscilloscope probe interface
Realize automatic unit scaling and reading on oscilloscope screen
Easy access to the oscilloscope probe menu screen for probe status/diagnostic information and to control probe dc bias
Remote GPIB/USB probe control is realized through oscilloscope
application
Verification, debugging and verification of high-speed design
Signal integrity, jitter, and timing analysis
Manufacturing engineering and testing
The signal's voltage swing is up to 8 vpk-pk
Selecting the right probe for the application is the key to obtain the best signal fidelity in measurement. Active probe provides more real signal replication and fidelity for high frequency measurement. The TAP2500 and TAP3500 single-ended active FET probes provide the superior high-speed electrical and mechanical properties required for today's digital system designs through ultra-low input capacitors and unique interfaces.
TAP2500 and TAP3500 active FET probe specially designed, can be used and connected directly to the with TekVPI ™ oscilloscope probe interface, by solving the problem of the following three traditional fidelity of high-speed signal acquisition and measurement:
By 0.8 pF input capacitance and 40 k or less loading Ω input impedance to reduce the DUT
Connect to a small SMD using a multifunctional DUT connection
The instrument bandwidth is reserved for an oscilloscope up to 3.5ghz at the end of the probe
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