主要性能指标
低时基抖动:
8 条同时采集的通道上典型值为 425 fs
82A04B 相位基准模块中，最多 6 条通道上 <100 fs
垂直分辨率 – 16 位模数转换器
电接口分辨率：<20 µV LSB（适用于 1 v 全量程）
光接口分辨率从 80C07B（1 mW 全量程）的 <20 nW 到 80C10C（30 mW 全量程）的 <0.6 µW
光接口带宽 >80 GHz
电接口带宽 >70 GHz
为 NRZ、RZ 和脉冲信号类型提供了超过 120 种自动测量功能
80 多种行业标准模板，自动进行模板测试
复杂抖动/噪声/BER/SER 分析 (80SJNB)，支持复杂测量 TDECQ 1, SNDR 2 (应用)
1PAM4 发射机和色散眼图闭合象限。
2S信噪失真比。
主要特点
各种光接口模块、电接口模块和附件模块可以满足您的特定测试要求。
光接口模块
支持从 155 Mb/s 到 10 Gb/s、40 Gb/s、100 Gb/s 和 50G/100G/200G/400G PAM4 光数据速率的光模块
光基准接收机(ORR) 1 满足了标准规定的一致性测试中的要求
光接口采样模块提供了高光学灵敏度、低噪声及宽动态范围，可以准确地测试和检定短程到远程光接口通信标准
经过全面校准的时钟恢复解决方案 – 不需要手动校准数据捡拾损耗
已校准消光比测量和变量校正 ER 测量可确保精度和重复能力
电接口模块
超低噪声电采样器（20GHz 时 280 μV，60GHz 时 450 μV，典型值）
可以选择带宽2，用户可以平衡带宽和噪声，实现优秀的数据采集性能
远程采样器或紧凑的采样扩展器模块电缆限度地减少信号劣化，因为采样器可以放在被测器件附近
高性能集成 TDR（10 ps 典型步进上升时间）支持杰出的阻抗不连续性检定，对带宽高达 50GHz 的 S 参数测量提供了高动态范围
分析
对速率在 <1 GBd 到 60 GBd 之间的高速 PAM4 和 PAM2 NRZ 串行数据执行抖动、噪声和 BER 分析，了解眼图闭合的确切原因
分析 PAM4 信号，全面分析每一个 PAM 眼图的抖动、噪声和 BER，并支持一套全局测量，评估 PAM4 信号整体属性
100G-SR4/发射机和色散眼图闭合 (TDEC) 自动化提供对 SR4 短程以太网至关重要的 TX 光属性的全套测试和调试
80STDEC 简化了高性能发射机和色散眼图闭合 (TDEC) 测量，使其非常适合生产和一致性验证应用
自动模板测试，支持 80 多种行业标准模板。新模板可以导入 DSA8300，支持各种新兴标准。用户可以定义自己的模板，自动进行模板测试
抖动、噪声、BER、模板测试和串行数据链路分析 (SDLA) 通过 80SJNB Essentials 和 Advanced 应用软件选项提供
高级 TDR 分析、S 参数测量、仿真模型提取和串行链路仿真功能通过 IConnect® 应用软件选项提供
400G-M4 光制造分析软件提供了光发射机和色散眼图闭合象限(TDECQ)分析功能
高测试吞吐量
每条通道高达 200 kS/s 的高采样率
高效编程接口（IEEE-488、以太网或本地处理器接入）实现高测试吞吐量
1光基准接收机(ORR)是一种四阶 Bessel-Thompson 滤波器，拥有标准规定的频响和容限。泰克优化了响应，实现标称拟合和高质量的模板测试结果。
2参阅 80E00 电采样模块产品技术资料，获得每种模块的详细介绍。
应用
设计/检验电信和数据通信器件和系统
ITU/ANSI/IEEE/SONET/SDH 制造/一致性测试
高性能真正差分 TDR 测量
串行数据应用阻抗检定和网络分析，包括 S 参数
高级抖动、噪声、BER和SDLA分析
使用IConnect基于通道和眼图仿真和测量建模
杰出的性能，优异的通用性
DSA8300 数字串行分析仪为开发和测试采用几千兆位数据传输技术的通信、计算机和消费电子提供了用途广泛的工具。它可以用来对这些产品中使用的器件、模块和系统的光接口和电接口发射机进行检定及一致性验证。
此外，DSA8300 特别适合电接口信号路径检定，包括封装、PCB 或电缆。由于杰出的带宽、信号保真度及可扩展性的模块化架构，DSA8300 为当前和新兴串行数据技术提供了性能的 TDR 和互连分析能力、准确的信号损伤分析能力以及 BER 计算功能。
Key performance indicators
Low base jitter:
The typical value on the maximum 8 simultaneous acquisition channels is 425 fs
In 82A04B phase reference module, <100 fs on up to 6 channels
Vertical resolution - 16 bit AD converter
Electrical interface resolution: <20 V LSB (suitable for 1 V full range)
The optical interface resolution ranges from <20 nW at 80C07B (1 mW full range) to <0.6 W at 80C10C (30 mW full range)
Optical interface bandwidth >80 GHz
Electrical interface bandwidth >70 GHz
More than 120 automatic measurement functions are provided for NRZ, RZ and pulse signal types
More than 80 industry standard templates, automatic template testing
Complex jitter/noise /BER/SER analysis (80SJNB), support complex measurement TDECQ 1, SNDR 2 (application)
Pam4 transmitter and dispersion eye diagram closed quadrant.
2S SNR.
The main features
Various optical interface modules, electrical interface modules and accessories modules can meet your specific test requirements.
Optical interface module
PAM4 supports light modules ranging from 155 Mb/s to 10 Gb/s, 40 Gb/s, 100 Gb/s, and 50G/100 g /200G/400G PAM4 light data rates
Optical reference receiver (ORR) 1 meets the requirements specified in the conformance test specified in the standard
Optical interface sampling module provides high optical sensitivity, low noise and wide dynamic range, which can accurately test and verify short-range to long-range optical interface communication standards
Fully calibrated clock recovery solution - no manual calibration data collection loss required
Calibrated extinction ratio measurements and variable correction ER measurements ensure accuracy and repeatability
Electrical interface module
Ultra-low noise electrical sampler (280 V at 20GHz, 450 V at 60GHz, typical values)
Bandwidth 2 can be selected. Users can balance bandwidth and noise to achieve excellent data acquisition performance
Remote sampler or compact sampler expander module cable minimizes signal degradation because the sampler can be placed near the device under test
High performance integrated TDR (10 ps typical step rise time) supports outstanding impedance discontinuity verification, providing a high dynamic range for S parameter measurements with bandwidth up to 50GHz
Analysis of the
Jitter, noise and BER analysis were performed on high-speed PAM4 and PAM2 NRZ serial data with a rate between <1 GBd and 60 GBd to understａnd the exact cause of eye pattern closure
PAM4 signal is analyzed, the jitter, noise and BER of each PAM eye image are comprehensively analyzed, and a set of global measurement is supported to evaluate the overall properties of PAM4 signal
The 100g-sr4 / transmitter and dispersion eye pattern closure (TDEC) automation provides a full suite of testing and debugging of the TX attributes critical to SR4 short-range Ethernet
The 80STDEC simplifies high performance transmitter and dispersion eye pattern closure (TDEC) measurements, making it ideal for production and consistency verification applications
Automatic template testing, support more than 80 industry standard templates. The new template can be imported into DSA8300, supporting various emerging standards. Users can define their own templates, template testing automatically
Jitter, noise, BER, template testing, and serial data link analysis (SDLA) are provided with 80SJNB Essentials and Advanced application software options
Senior TDR analysis, extraction and serial links S parameter measurement, the simulation model simulation function through IConnect ® options provide application software
The 400g-m4 optical manufacturing analysis software provides optical transmitter and dispersion eye diagram closed quadrant (TDECQ) analysis functions
High test throughput
Each channel has a high sampling rate of up to 200 kS/s
Efficient programming interfaces (ieee-488, Ethernet, or local processor access) achieve high test throughput
The optical reference receiver (ORR) is a four - order Bessel-Thompson filter with standard frequency response and tolerances. Tektronix optimizes the response to achieve nominal fit and high quality template test results.
Refer to 80E00 electrical sampling module product technical data for detailed introduction of each module.
application
Design/test telecommunication and data communication devices and systems
ITU/ANSI/IEEE/SONET/SDH manufacturing/conformance testing
High performance real differential TDR measurement
Impedance verification and network analysis are applied to the serial data, including S parameters
Advanced jitter, noise, BER and SDLA analysis
IConnect was used for channel - and eye-based simulation and measurement modeling
Excellent performance, excellent versatility
The DSA8300 digital serial analyzer provides a wide range of tools for developing and testing communications, computers and consumer electronics using thousands of megabits of data transmission technology. It can be used for verification and consistency verification of optical and electrical interface transmitters of devices, modules and systems used in these products.
In addition, the DSA8300 is particularly suitable for electrical interface signal path verification, including encapsulation, PCB or cable. Due to the outstanding bandwidth, signal fidelity and scalability of the leading modular architecture, DSA8300 for the current and emerging serial data technology provides super performance TDR and interconnection analysis capabilities, accurate signal damage analysis capabilities and BER computing functions.
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