TDP3500低压差分探头

特性和优点

• 出色的电子性能

• 3.5 GHz 和 1.5 GHz 带宽型号 – 准确测量串行和数字应用

• 出色的共模抑制 – 减少更高共用环境中的错误

• 低电容和电阻负载 – 保持信号保真度并降低直流偏压相互影响

• 全面的机械性能

• 用于探测小型几何电路元件的紧凑型探头头部尺寸

• 利用 DUT 连接附件能够连接适当间隔的 SMD

• 强大的可靠性设计

• 易用性

• 直接连接到具有 TekVPI™ 探头接口的示波器

• 在示波器画面上实现自动单位缩放和读数

• 轻松访问探头补偿盒控制或示波器探头菜单显示，了解状态、设置控制和诊断信息

• 集成示波器/探头系统

• 直接连接 TekVPI™ 示波器接口并从中供电（直接连接至 TekVPI 示波器，无需像许多竞争对手要求的那样需要外部电源）

• 单键访问示波器探头菜单

• 从探头补偿盒或示波器用户界面进行设置和控制

• 自动调零 – 输出偏置调零

• 通过示波器实现远程 GPIB/USB 探头控制

应用

• 常见高速串行总线设计的设计、验证、调试和检定：

• I2C

• CAN/LIN

• SPI

• 串行 ATA

• 以太网 (GbE)

• USB 2.0

• FireWire (1394b)

• 信号完整性、抖动和定时分析

• 制造工程和测试

差分探头 – 更好的测量工具

差分有源探头为高频测量提供了更真实的信号复制和保真度。通过超低输入电容和通用被测设备连接能力，TDP1500 和 TDP3500 差分端有源探头提供了当今数字系统设计所需要的的高速电子和机械性能。

TDP1500 和 TDP3500 差分探头经过专门设计，可使用和直接连接到带有 TekVPI™ 探头接口的示波器，通过解决以下三个传统问题来实现高速信号采集和测量保真度：

• DUT 负载效应 – 通过降低输入电容和高输入电阻来减少

• DUT 连接能力 – 各种附件可用于连接小型 SMD，一些为标配，一些为推荐使用

• 系统（示波器和探头）带宽 – 用于高达 3.5 GHz 的 TekVPI 接口示波器型号所有测量的探测解决方案

Features and benefits

Excellent electronic performance

3.5ghz and 1.5ghz bandwidth models - accurate measurement of serial and digital applications

Excellent common mode suppression - reduces errors in higher common environments

Low capacitance and resistance load - maintains signal fidelity and reduces dc bias interaction

Overall mechanical properties

Compact probe head dimensions for detection of small geometric circuit elements

Use the DUT connection attachment to be able to connect properly spaced SMDS

Strong reliability design

Ease of use

Directly connected to a TekVPI ™ oscilloscope probe interface

Realize automatic unit scaling and reading on oscilloscope screen

Easily access the probe compensation box control or oscilloscope probe menu display to understａnd the status, setting control and diagnostic information

Integrated oscilloscope/probe system

Direct connection TekVPI ™ oscilloscope interface and power supply (direct connection to TekVPI oscilloscope, need not need as many competitors require external power supply)

Single key access oscilloscope probe menu

Setup and control from the probe compensation box or oscilloscope user interface

Auto zero - output offset zero

Remote GPIB/USB probe control is realized through oscilloscope

application

Design, verification, debugging and verification of common high-speed serial bus design:

I2C

CAN/LIN

SPI

Serial ATA

Ethernet (GbE)

USB 2.0

FireWire (1394 b)

Signal integrity, jitter, and timing analysis

Manufacturing engineering and testing

Differential probe - a better measuring tool

Differential active probe provides more real signal replication and fidelity for high frequency measurement. The TDP1500 and TDP3500 differential end active probes provide the superior high-speed electronic and mechanical performance required for today's digital system design through ultra-low input capacitance and universal device connectivity.

TDP1500 and TDP3500 difference probe specially designed, it can be used and connected directly to the with TekVPI ™ oscilloscope probe interface, by solving the problem of the following three traditional fidelity of high-speed signal acquisition and measurement:

DUT load effect - reduced by reducing input capacitance and high input resistance

DUT connectivity - a variety of accessories can be used to connect small SMDS, some standard, some recommended

System (oscilloscope and probe) bandwidth maximization - detection solution for all measurements up to 3.5 GHz TekVPI interface oscilloscope models