B1530A波形发生器/快速测量单元

主要特性与技术指标

没有线路负载效应的真正脉冲/瞬态测量解决方案

整合了任意波形生成和高速 IV 测量功能

利用是德科技的动态 SMU 技术，消除了线路负载效应，确保进行准确的脉冲 IV 测量

解决方案支持超快速 IV（电流-电压）测量、脉冲 IV 测量和瞬态 IV 测量，例如 NBTI/PBTI 和 RTN（随机电报信号噪声）测量等

测量功能

直流输出和任意波形生成，具有 10 ns 的可编程分辨率（10V 峰-峰值输出）

高速电压/电流测量（200 MSa/s，5ns 采样率）

任意波形输出的动态范围可以调整，实现更宽广的电流范围

双通道输出

描述

是德科技设计的高速 SMU 技术可以摆脱线路负载效应的影响，进行更准确的脉冲和瞬态测量

超快速 IV、脉冲 IV 和瞬态 IV 测量正逐渐成为研发下一代半导体、器件和材料时的一项常见要求。Keysight B1500A 系列中的 Keysight B1530A 波形发生器/快速测量单元（WGFMU）是用于上述时间相关测量的理想测量模块。这些测量通常是由脉冲发生器和示波器共同完成，然而线路负载效应（剩余电阻导致的压降误差）会对测量准确性产生不利影响。B1530A WGFMU 结合了任意波形生成和同时执行高速测量的功能，而是德科技的动态 SMU 技术则可以消除线路负载效应，因此与基于脉冲发生器的解决方案相比，它可使用户执行更准确、更灵敏的测量。这个解决方案功能非常强大，十分适合执行高精度、超快速的 IV 测量、脉冲 IV 测量和瞬态 IV 测量，例如超快速 NBTI 和 RTN 测量。

Main features and technical indicators

Real pulse/transient measurement solutions without line load effects

Integration of arbitrary waveform generation and high-speed IV measurement function

The SMU technology, which is unique to DE tech, eliminates line load effects and ensures accurate pulse IV measurements

The solution supports ultra-fast IV (current-voltage) measurements, impulse IV measurements, and transient IV measurements, such as NBTI/PBTI and RTN (random telegraph signal noise) measurements

Measurement functions

Dc output and arbitrary waveform generation, with 10 ns programmable resolution (10V peak-peak output)

High-speed voltage/current measurement (200 MSa/s, 5ns sampling rate)

The dynamic range of any waveform output can be adjusted to achieve a wider current range

Dual channel output

describe

It is the latest high speed SMU technology designed by teck technology, which can get rid of the influence of line load effect and conduct more accurate pulse and transient measurement

Ultra-fast IV, pulse IV, and transient IV measurements are becoming a common requirement in the development of next-generation semiconductors, devices, and materials. The Keysight B1530A waveform generator/rapid measurement unit (WGFMU) in the Keysight B1500A series is an ideal measurement module for the above time-dependent measurements. These measurements are usually performed by a pulse generator and an oscilloscope, but line load effects (voltage drop errors due to residual resistance) can adversely affect measurement accuracy. B1530A WGFMU combines the ability to generate arbitrary waveforms and simultaneously perform high-speed measurements. However, the dynamic SMU technology, which is unique to DE tech, can eliminate the line load effect. Therefore, compared with the pulse-based solution, it enables users to perform more accurate and sensitive measurements. This solution is powerful enough to perform high-precision, ultra-fast IV measurements, pulse IV measurements, and transient IV measurements, such as ultra-fast NBTI and RTN measurements.